AMETEK Compact i/iX Series - Manual (Page 140)

User Manual Compact i/iX Series
AMETEK Programmable Power California Instruments 140

0V for 2 seconds.

100V for 8 seconds.
The

key (backspace) will terminate the test at any time.
OVER FREQUENCY
This test will change the output frequency in the sequence shown in Table 10-4 before returning to the
steady state frequency.
The

key (backspace) will terminate the test at any time.
Revision D E F F 60Hz only
FREQ Time FREQ Time FREQ TIME FREQ TIME
Seq1 480Hz 5sec. 480Hz 5sec. 480Hz 5sec 61Hz 7sec
Seq2 420Hz 5sec 420Hz 9sec 420Hz 5sec 60.5Hz 8sec
Table 10-4: Abnormal Over Frequency
After this sequence, a 5 second delay will be inserted at the nominal test frequency. The

key
(backspace) will terminate the test at any time.
UNDER FREQUENCY
This test will change the output frequency in the sequence shown in Table 10-5 before returning to
steady state frequency.
The

key (backspace) will terminate the test at any time.
Revision D E F F 60Hz only
FREQ Time FREQ Time FREQ TIME FREQ TIME
Seq1 0 5sec. 0Hz 7sec. 0Hz 7sec 0Hz 7sec
Seq2 375Hz 5sec 380Hz 7sec 380Hz 3sec 59.5Hz 8sec
Table 10-5: Abnormal Under Frequency
After this sequence, a 5 second delay will be inserted at the nominal test frequency. The

key
(backspace) will terminate the test at any time.