AMETEK Compact i/iX Series - Manual (Page 136)

User Manual Compact i/iX Series
AMETEK Programmable Power California Instruments 136
WAVEFORM DISTORTION
This test will generate a 5% THD voltage distortion on the output voltage waveform. Using a clipped
sine wave causes the distortion. The test will last for 2 minutes. The

key (backspace) will terminate
the test at any time.
HIGH VOLTAGE TRANSIENT
This test will change the output voltage for the selected phase in the following sequence:
For 400 Hz and VFREQ:

180V for 10msec.

Linearly reduced to118V in 78msec.

Stay at 118V for 87msec before returning to 115V.
For 60 Hz only:

170V for 1.67msec

Linearly reduced to 130V in 14msec.

Linearly reduced to 120V in 83.3msec.

Stay at 120V for 75msec.
Note: Prior to the test, a voltage range change may take place if the power source is set for the low
voltage range. This will cause the EUT to loose power momentarily. If this is not acceptable, the power
source must be left in high range at all times.
After this sequence, a 5 second delay will be inserted at the nominal test voltage. The

key (backspace)
will terminate the test at any time.
LOW VOLTAGE TRANSIENT
This test will change the output voltage for the selected phase only in the following sequence:
For 400 Hz and VFREQ:

80V for 10msec.

Linearly increase to108V in 70msec.

Stay at 108V for 95msec before returning to 115V.
For 60Hz only:

0V for 1.67msec.

Linearly increase to 70V in 14msec.

Linearly increase to 105V in 83.3msec

Stay at 105V for 75msec.
After this sequence, a 5 second delay will be inserted at the nominal test voltage. The

key (backspace)
will terminate the test at any time.
HIGH FREQUENCY TRANSIENT
This test will change the output frequency in the following sequence:
For 400Hz and VFREQ:

425Hz for 1 sec.