AMETEK Compact i/iX Series - Manual (Page 135)

User Manual Compact i/iX Series
AMETEK Programmable Power California Instruments 135
FREQUENCY
This test will change the output frequency in the sequence shown in Table 10-2.
SEQUENCE FREQUENCY TIME
400Hz VFREQ 60 Hz
1 393 360 59 1 minute
2 407 800 61 1 minute
3 400 SSF 60 1 minute
Table 10-2: Steady state frequency
The

key (backspace) will terminate the test at any time.
VOLT UNBALANCE
This test will change the output voltage for the selected phase only in the following sequence:

112V for 1 minute.

118V for 1 minute.

115V for 1 minute.
The test will be repeated on three phase systems to include all three phases if the coupling is set to all.
The

key (backspace) will terminate the test at any time.
PHASE DIFFERENCE
This test applies to three phase systems only. The phase angle for the selected phase will change
relative to phase A in the following sequence:
If phase B is selected:

236

for 1 minute.

244

for 1 minute.

240

for 1 minute.
If phase C is selected:

116

for 1 minute.

124

for 1 minute.

120

for 1 minute
VOLTAGE MODULATION
This test will vary the output voltage by

2.5V rms over a period of one second. The test will last for 2
minutes. The

key (backspace) will terminate the test at any time.
FREQUENCY MODULATION
REVISION D E F (400Hz /VFREQ) F (60HZ)
MODULATION 
7Hz

4Hz

4Hz

0.5Hz
Table 10-3: Frequency Modulation
This test will vary the output frequency as defined by Table 10-3 over a period of one minute. The test
will last for 4 minutes. The

key (backspace) will terminate the test at any time.