Teledyne LeCroy Conquest User Manual - Users Manual User Manual
Page 61
Protocol Analysis
51
High Speed Test Mode
When a High Speed USB Device is set into a Test_Packet mode it must
respond with a standard Data0 packet with pre-defined data. Selecting this
option allows capture of this packet.
High Speed Test Mode Usage
1. Set Test Mode on the Device (the exerciser can do this).
2. On the Settings tab, set Analyzer Speed to High Speed instead of
Autospeed and select the High Speed Test Mode.
3. Press Run to capture the test packet.
Trigger Mask
If you selected an External Trigger as described on page 40, click the Trigger
Mask button in the Project Settings dialog repeatedly to set a trigger option.
External Bits
To output a data pattern whenever a trigger occurs, enter a pattern in the
External_Bits text box in Easy Mode and in the Sequencer when operating in
the Advanced Mode. To access the data pattern as external signals see
“Conquest M2 External I/O Connector Pin Assignment” on page 15.
Transaction Retry
The settings dialog default is per USB specification, however, you can enter
non standard conditions for the application.
To trigger on a “0” level.
To trigger on a “1” level
To trigger on a rising edge.
To trigger on a falling edge.