20 test and measurement interface signals – AMD Geode SC1201 User Manual
Page 69
AMD Geode™ SC1200/SC1201 Processor Data Book
69
Signal Definitions
32579B
TDO
E30
O
JTAG Test Data Output
---
TMS
F28
I
JTAG Test Mode Select. This signal has an internal weak
pull-up resistor.
---
TRST#
E29
I
JTAG Test Reset. This signal has an internal weak pull-up
resistor.
For normal JTAG operation, this signal should be active at
power-up.
If the JTAG interface is not being used, this signal can be
tied low.
---
3.4.19
JTAG Interface Signals (Continued)
Signal Name
Ball No.
Type
Description
Mux
3.4.20
Test and Measurement Interface Signals
Signal Name
Ball No.
Type
Description
Mux
GXCLK
V30
O
GX Clock. This signal is for internal testing only. For nor-
mal operation either program as FP_VDD_ON or leave
unconnected.
FP_VDD_ON+
TEST3
TEST3
V30
O
Internal Test Signal. This signal is used for internal test-
ing only. For normal operation leave unconnected, unless
programmed as FP_VDD_ON.
FP_VDD_ON+
GXCLK
TEST2
AJ1
O
Internal Test Signals. These signals are used for internal
testing only. For normal operation leave unconnected.
PLL5B
TEST1
AG4
O
PLL6B
TEST0
AH3
O
PLL2B
GTEST
F30
I
Global Test. This signal is used for internal testing only.
For normal operation this signal should be pulled down
with 1.5 K
Ω.
---
PLL6B
AG4
I/O
PLL6, PLL5 and PLL2 Bypass. These signals are used
for internal testing only and requires additional test modes
to observe the PLLs. These modes are not described in
this specification. For normal operation leave uncon-
nected.
TEST1
PLL5B
AJ1
I/O
TEST2
PLL2B
AH3
I/O
TEST0
SDTEST5
D28
O
Memory Internal Test Signals. These signals are used
for internal testing only. For normal operation, these sig-
nals should be programmed as one of their muxed
options.
GPIO6+
DTR2#/BOUT2+
IDE_IOR1#
SDTEST4 C31
O
GPIO8+CTS2#+
IDE_DREQ1
SDTEST3 E28
O
SIN2
SDTEST2 C28
O
GPIO9+DCD2#+
IDE_IOW1#
SDTEST1 B29
O
GPIO10+DSR2#+
IDE_IORDY1
SDTEST0 C30
O
GPIO7+RTS2#+
IDE_DACK1#
TDP
D30
I/O
Thermal Diode Positive / Negative. These signals are for
internal testing only. For normal operation leave uncon-
nected.
---
TDN
D31
I/O