HP B1000 - Manual (Page 71)

Chapter 3 71
Troubleshooting
Selftest Failures
FLT 730C SYS BD mem intrlv fail Memory interleave generation failed.
INI 730F SYS BD mem config done Main memory configuration complete.
TST 7400 DIMM non-dest mem tst Starting non-destructive memory test.
TST 740F DIMM non-dst tst done Non-destructive memory test complete.
INI 7500 SYS BD memory reset Resetting memory system.
WRN 7501 SYS BD mem log clr warn Memory error logs didn’t clear on first try.
FLT 7502 SYS BD mem err log fail Firmware could not clear memory error
logs.
TST 7600 DIMM dest mem test Starting the destructive memory test.
WRN 7601 DIMM mem init only Skip the test, just initialize memory to
save time.
TST 7602 DIMM tst 1st mem page Starting 3-pass test of first memory page.
TST 7603 DIMM tst rest of mem Starting 3-pass test of the rest of memory.
TST 7604 DIMM start 1st pass Starting 1st pass of memory test (write
pseudorandom sequence).
TST 7605 DIMM 1st pass x% First pass is x% complete.
TST 7606 DIMM start 2nd pass Starting 2nd pass of memory test (verify
pseudorandom sequence, write inverse).
TST 7607 DIMM 2nd pass x% Second pass is x% complete.
TST 7608 DIMM start 3rd pass Starting 3rd pass of memory test (verify
inverse sequence).
TST 7609 DIMM 3rd pass x% Third pass is x% complete.
TST 760A DIMM start mem init Starting memory initialization. (Initialize
to zero to set ECC.)
TST 760B DIMM mem init x% Memory initialization is x% complete.
WRN 760C DIMM repeat dest test Re-execute destructive test for hardware
troubleshooting.
FLT 760D DIMM mem code cpy err Firmware tried to copy code from ROM to
memory, but the copy didn’t match the
original.
FLT 7610 DIMM ECC wrt/read err Writing and reading back good data
caused memory ECC error.
FLT 7611 DIMM ECC single data Memory ECC test failed to detect
single-bit data error.
Table 3-2. Chassis Codes for B1000/C3000 Workstations
Ostat Code FRU Message Description