Metrohm NIRS XDS Process Analyzer – DirectLight/NonContact - Manual (Page 99)

▪▪▪▪▪▪▪ 97
Select Wavelength Linearization from the
Diagnostics menu. The instrument will scan the
reference, which is the fiber optic that runs from
the monochromator to the detector area inside the
instrument.
Peak positions for the reference materials are located using a peak-finding algorithm. These “found”
peaks are compared to the nominals. This is done twice, one for each direction of the grating
motion. No operator interaction is required.
After the linearization is successfully sent to the instrument, this message confirms the transfer.
Click “OK” to proceed.