3 instrument specifications, 1 enclosure options for specific environments, 2 dimensions – Metrohm NIRS XDS Process Analyzer – DirectLight/NonContact User Manual
Page 24: Instrument specifications, Enclosure options for specific environments, Dimensions, 3instrument specifications
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Instrument Specifications
The XDS Process Analytics Single Point Analyzer uses Near Infrared (NIR) energy to determine
chemical and physical characteristics of the sample. The sample is illuminated with white light
through a fiber optic bundle. The light is returned through a separate fiber bundle path, and the
returning signal is broken down into visible and NIR wavelengths for spectroscopic analysis. The
spectroscopic data is processed using a PC, and results are output in real time. This permits on-the-fly
adjustment of the process to maintain optimum characteristics.
Instrument Specifications are as follows:
3.1
Enclosure Options for Specific Environments
•
Class I Div. I, group B, C and D, Class I Zone 1
X Purge withVortec Cooler; Fiber Optic Communication Modems
•
Class I Div. 2
X Purge with Air Conditioner; Fiber Optic Communication Modems
•
CENELEC-Approved
X Purge withVortec Cooler; Fiber Optic Communication Modems
•
Non-Purged Enclosure Options:
•
Fan Cooled, for environments 0-35 degrees C (32-95º F)
•
Air-conditioned, for environments 0-51 degrees C (32-125º F)
•
Vortec Cooled, for environments 0-40 degrees C (32-104º F)
•
Temperature Probes are offered for process monitoring with all models
3.2
Dimensions
Basic System:
•
19.25”
(489mm) wide with heat sink and fan assembly
•
24”
(609.6mm) high
•
14”
(355.6mm) deep
There is a 3.25” (82.6mm) heat sink and fan on the right side of the enclosure.
Overall Maximum Size with Purge System, fiber hookup area, and other options:
•
30.56”
(776.3mm) wide
•
30.45”
(773.5mm) high
•
14.06”
(357.2mm) deep
Access room should be left on all sides for service, and in front for the door opening.