Metrohm NIRS XDS Process Analyzer – DirectLight/NonContact User Manual

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Instrument must stabilize before data acquisition:

This prevents spectral acquisition if the instrument is cold.

Performance Test must pass before data acquisition:

This prevents the user from taking data on a non-functional instrument. Forces user to run test
sequentially. This is not necessary with XDS.

Use Auto-Linearization:

Maintains correct wavelength registration automatically, using internal wavelength materials to keep
instrument in precise adjustment over time.

Reference Standardization:

Used to create a virtual 100% reflectance reference, using a traceable photometric standard. This is
explained in the next section. Required for Calibration Transfer in Reflectance.

Master Standardization:

This method is not used with XDS. Do not select.

Use Instrument Calibration (XDS only):

This is a method to adjust the instrument wavelength profile to an external, traceable wavelength
standard. It is checked as a default for XDS. Required for Calibration Transfer.

Use Window Correction:

Select this when using XDS Process instrument with either Transmission Pair, or Interactance
Immersion probes. This option should not be used with Interactance Reflectance.

When calibration or library transfer (between instruments) is anticipated, be sure that

Reference Standardization and Instrument Calibration are selected, BEFORE creation of a

DCM. These features assure best method transfer between similar instruments.

Vision confirms the instrument configuration upon the first test to be saved to the Diagnostic
Database.

This screen is normally displayed, with serial
numbers for the system in use.

If this configuration is correct, click on “OK” to
proceed with tests.