Teledyne LeCroy WaveRunner МXi-A Getting Started Manual - Manual (Page 59)

Getting Started Manual
922138-00 Rev A 51
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apply a descriptive label to the feature.

Scan Histogram provides a statistical view of edges meeting your search
criteria.

Scan Overlay places all captured edges one on top of the other in a
separate grid. You can apply persistence in this view.
NOTE: The number of grids displayed varies from one to three grids depending
on which views are enabled. WaveScan handles this function automatically,
and there is no option to move traces from one grid to another, as would be
the case under normal (non-WaveScan) operation.
WaveScan Search Modes
Search modes are used to locate anomalies during acquisition.

Edge - for detecting the occurrence of edges, selectable slope, and level

Non-monotonic - for detecting threshold re-crosses, selectable slope,
hysteresis, and level

Runt - for detecting pulses that fail to cross a threshold, selectable
polarity, and thresholds

Measurement - for defining a measurement with a filtering (search or
scan) criteria
Parameter Measurements
In WaveScan, parameter measurements are used to set up a filtering (search
or scan) criteria. When WaveScan finds an event that meets the measurement
and filter criteria, it highlights the area (search and scan) and (optionally) can
perform an action (scan).
The number of parameters available depends on the options loaded on your
instrument. Measurements are made only on the events defined by your filter
(search criteria). A Filter Wizard is provided to quickly set up a measurement
to find rare events, such as ±1, 3, or 5 sigma.
Sampling Mode
Whenever WaveScan is enabled, the instrument reverts to Real-time sampling
mode.