Freescale Semiconductor ColdFire MCF52210 - Manual (Page 551)

IEEE 1149.1 Test Access Port (JTAG)
MCF52211 ColdFire® Integrated Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 29-7
Figure 29-4. TAP Controller State Machine Flow
29.4.3 JTAG Instructions
Table 29-5 describes public and private instructions.
Table 29-5. JTAG Instructions
Instruction IR[3:0] Instruction Summary
EXTEST 0000 Selects boundary scan register while applying fixed values to output pins and
asserting functional reset
IDCODE 0001 Selects IDCODE register for shift
SAMPLE/PRELOAD 0010 Selects boundary scan register for shifting, sampling, and preloading without
disturbing functional operation
ENABLE_TEST_CTRL 0110 Selects TEST_CTRL register
RUN-TEST/IDLE
TEST-LOGIC-RESET
1
1
SELECT DR-SCAN
CAPTURE-DR
EXIT1-DR
PAUSE-DR
UPDATE-DR
SELECT IR-SCAN
SHIFT-DR
EXIT2-DR
CAPTURE-IR
SHIFT-IR
EXIT1-IR
PAUSE-IR
EXIT2-IR
UPDATE-IR
0
0
1
1
0
0
0
1
1
1 0
0
0
1
1
0
0
1
1
0
1
0
1
1 0
1
1
0
0
1
0