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Operation, 5 status messages and diagnostic information – KROHNE OPTISONIC 3400 EN User Manual

Page 83

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OPERATION

6

83

OPTISONIC 3400

www.krohne.com

11/2013 - 4002037702 - HB OPTISONIC 3400 -en-R02

6.5 Status messages and diagnostic information

The diagnostic messages are displayed in accordance with NAMUR standard NE 107. NE 107
states that there are up to 32 status groups which can have different status signals. NE 107 was
implemented with 16 status groups with fixed status signals and 8 groups with variable status
signals. To facilitate identification of the problem source, the status groups are then divided into
the groups: Sensor, Electronics, Configuration and Process.

The variable status signal can be changed in menu Mapping; C1.10.3 ...8

Mapping; C1.10.3 ...8

Mapping; C1.10.3 ...8

Mapping; C1.10.3 ...8. Changing the status

signal to "Information", switches off the message.

Each status message (= status signal) has a specific symbol, determined by NAMUR, which is
displayed with the message. The length of each message is limited to one line.

All status messages are saved in the status log (menu B3.1). Use the ↑ and ↓ keys to navigate
through this list. Use the ^ key to exit the list.

The status screen shows the status groups of all errors that have occurred since the last time
the status screen was opened. All errors that are not current disappear after 2 seconds. They
are shown in the list in brackets.

INFORMATION!
As status message always the name of the relevant status group and the status signal (F/S/M/C)
is displayed.

Symbol Letter

Status signal

Description and consequence

F

F

F

F

Failure

No measurement possible.

S

Out of specification

Measurements are available but are

no longer sufficiently accurate and

should be checked

M

Maintenance required

Measurements are still accurate but

this could soon change

C

Function check

A test function is active; The displayed

or transferred measured value does

not correspond to the actual measured

value.

I

Information

No direct influence on the

measurements