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2 test clock input (tclk), 3 test mode select/breakpoint (tms/bkpt), Ag is selected – Freescale Semiconductor ColdFire MCF52210 User Manual

Page 547: Table 29-2, Summarizes the pin func

2 test clock input (tclk), 3 test mode select/breakpoint (tms/bkpt), Ag is selected | Table 29-2, Summarizes the pin func | Freescale Semiconductor ColdFire MCF52210 User Manual | Page 547 / 576 2 test clock input (tclk), 3 test mode select/breakpoint (tms/bkpt), Ag is selected | Table 29-2, Summarizes the pin func | Freescale Semiconductor ColdFire MCF52210 User Manual | Page 547 / 576
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