National Instruments AT-MIO-16X User Manual

Page 327

Index

AT-MIO-16X User Manual

I-18

RTSI latch, 3-19
RTSI switch

definition, 3-30
programming, 5-39 to 5-43

control pattern (figure), 5-40
DMA operations, 5-41 to 5-42
interrupts, 5-43

selecting internal update counter, 5-32
signal connections

description, 3-30
programming considerations,

5-37 to 5-39

signals (table), 5-38

RTSI Switch Register Group, 4-71 to 4-73

RTSICLK signal, 3-30
RTSITRIG bit, 4-8

S2 through S0 bits, 5-40
sample counters, programming, 5-17 to 5-20

sample counts 2 through 65,536, 5-18
sample counts greater than 65,536,

5-18 to 5-20

sample-interval counter, programming,

5-16 to 5-17

sample-interval timer, 3-9
scan interval, 5-10
scan interval counter, programming,

5-20 to 5-21

scan sequence, 5-10
SCANCLK signal

description (table), 2-18, B-5
multiple-channel data

acquisition, 3-12, 3-13

timing connections, 2-33
timing I/O circuitry, 3-29

SCANDIV bit

description, 4-6
programming multiple-analog input

channel configurations, 5-15

SCANEN bit

continuous channel scanning data

acquisition, 5-11

description, 4-7
interval-channel scanning data

acquisition, 5-14

SCLK bit, 4-5 to 4-6
SCN2 bit

description, 4-7
interval-channel scanning data

acquisition, 5-14

SDATA bit, 4-5
signal connections

analog input, 2-19 to 2-20
analog input configurations

common-mode signal rejection, 2-29
differential connections

DIFF input configuration, 2-22
floating signal sources,

2-24 to 2-26

ground-referenced signal

sources, 2-23

nonreferenced signal sources,

2-24 to 2-26

input modes, 2-7 to 2-11

available modes (table), 2-8
DIFF input, 2-8
NRSE input, 2-9 to 2-10
RSE input, 2-9

recommended configuration

(table), 2-22

single-ended connections,

2-26 to 2-27

floating signal sources (RSE

configuration), 2-27

grounded signal sources (NRSE

configuration), 2-28