National Instruments AT-MIO-16X - Manual (Page 306)

Glossary
© National Instruments Corporation G-23 AT-MIO-16X User Manual
S/s samples per second—used to express the rate at which a DAQ board
samples an analog signal
STC system timing controller
strain gauge a thin conductor, which is attached to a material, that detects stress or
vibrations in that material. The conductor’s resistance is a function of
the applied force.
statically configured a device whose logical address cannot be set through software; that is,
device it is not dynamically configurable
successive- an ADC that sequentially compares a series of binary-weighted values
approximation ADC with an analog input to produce an output digital word in n steps, where
n is the bit resolution of the ADC
switchless device devices that do not require dip switches or jumpers to configure
resources on the devices—also called Plug and Play devices
synchronous (1) hardware—a property of an event that is synchronized to a reference
clock (2) software—a property of a function that begins an operation
and returns only when the operation is complete
system RAM RAM installed on a personal computer and used by the operating
system, as contrasted with onboard RAM
system noise a measure of the amount of noise seen by an analog circuit or an ADC
when the analog inputs are grounded
T
TC terminal count—the highest value of a counter
T/H track-and-hold—a circuit that tracks an analog voltage and holds the
value on command
THD total harmonic distortion—the ratio of the total rms signal due to
harmonic distortion to the overall rms signal, in dB or percent
THD+N signal-to-THD plus noise—the ratio in decibels of the overall rms
signal to the rms signal of harmonic distortion plus noise introduced