KYORITSU 6310 Instruction Manual - Manual (Page 290)

16.7.1 Swell/ Dip/ Int measurement KEW6310
16.7
KEW6310
16.7 Power quality ( Range)
16.7.1 Swell/ Dip/ Int measurement
Meas. Method Calculate RMS values based on an overlapped waveform at every half waveform.
Judges the presence of events at every 1s.
Detection CH VN - V1
Display item (1) 1-sec avg
(2) Number of occurrence of Swell/ Dip/ Int
(3) Month/ date/ time when event began
(4) Month/ date/ time when event finished
(5) Duration
Save item Display items (3) ~ (5)
Data at the occurrence of event or before/ after the event (201 in total)
Recording start and end date and time
16.7.2 Transient measurement
Meas. Method Sampling at every 100μs, and calculating the max value at every 2ms
Judges the presence of events at every 1s.
Detection CH VN - V1
Display item (1) max value in 1 sec
(2) Number of event
(3) Year/ month/ date/ time when max voltage occurred
(4) Max voltage
Save item (3) & (4) of display items
Data before/ after the max voltage is recorded (201 in total)
Recording start and end date and time
16.7.3 Inrush current measurement
Meas. Method Calculate RMS values based on an overlapped waveform at every half waveform.
Judges the presence of events at every 1s.
Detection CH A1
Display item
(1) 1-sec avg
(2) Number of event (counting at the start of event)
(3) Month/ date/ time when event begin
(4) Month/ date/ time when event finish
(5) Max current
(6) Duration
Save item Display items (3) & (4)
Data before/ after the max voltage is recorded (201 in total)
Recording start/ end date and time
16.7.4 Unbalance rate measurement
Meas. Method vector display
Voltage / current unbalance rate
Save item (Measurement data at W Range) + (Unbalance rate)
Measurable
wiring
configuration
⑪ 3P3W3A, ⑫3P4W×1, ⑬3P4W×1+1A
Formula
) ( _ _
) ( _ _
current voltage phase positive
current voltage phase reversed
umb
=