Atec Agilent-E8364B - Manual (Page 116)

112
Table 35 (Continued). Test Port Input
Stability Magnitude
d
Typical ratio measurement, made at the test port.
10 MHz to
45 MHz
-- -- -- -- +/-0.05 dB/°C
45 MHz to
20 GHz
-- -- -- -- +/-0.02 dB/°C
20 GHz to
40 GHz
-- -- -- -- +/-0.03 dB/°C
40 GHz to
50 GHz
-- -- -- -- +/-0.04 dB/°C
Stability Phase
d
Typical ratio measurement, measured at the test port.
10 MHz to
45 MHz
-- -- -- -- +/-0.5°/°C
45 MHz to
20 GHz
-- -- -- -- +/-0.2°/°C
20 GHz to
40 GHz
-- -- -- -- +/-0.5°/°C
40 GHz to
50 GHz
-- -- -- -- +/-0.8°/°C
Damage Input Level
Test Port 1
and 2
-- -- -- --
+30 dBm or
+/-40 VDC,
typical
R1, R2 in -- -- -- --
+15 dBm or
+/-15 VDC,
typical
A, B in -- -- -- --
+15 dBm or
+/-15 VDC,
typical
Coupler Thru
(Option 014 or
UNL/014) -- -- -- --
+30 dBm or
+/-40 VDC,
typical
Coupler Arm
(Option 014 or
UNL/014) -- -- -- --
+30 dBm or
+/-7 VDC,
typical
a
Total average (rms) noise power calculated as the mean value of a linear magnitude trace expressed in dBm.
b
Typical performance.
c
Noise floor may be degraded by 10 dB at particular frequencies (multiples of 5 MHz) due to spurious receiver
residuals.
d
0 Hz offset
e
Trace noise magnitude may be degraded to 20 mdB rms at harmonic frequencies of the first IF (8.33 MHz)
below 80 MHz.
f
Stability is defined as a ratio measurement made at the test port.
g This compression level comes from the dynamic accuracy curve with -30 dBm reference test port power.