Table 2.2: configuration switch address settings, Test mode, Section 2.6 – INFICON STM-100/MF Thin Film Deposition Monitor User Manual
Page 31: Enabling the test mode, Switch setting address
Switch Setting
Address
SW8
SW9
SW10
SW11
SW12
IEEE
BITBUS / SECS II
off
off
off
off
off
0
32 / 0
off
off
off
off
on
1
1
off
off
off
on
off
2
2
off
off
off
on
on
3
3
off
off
on
off
off
4
4
off
off
on
off
on
5
5
off
off
on
on
off
6
6
off
off
on
on
on
7
7
off
on
off
off
off
8
8
off
on
off
off
on
9
9
off
on
off
on
off
10
10
off
on
off
on
on
11
11
off
on
on
off
off
12
12
off
on
on
off
on
13
13
off
on
on
on
off
14
14
off
on
on
on
on
15
15
on
off
off
off
off
16
16
on
off
off
off
on
17
17
on
off
off
on
off
18
18
on
off
off
on
on
19
19
on
off
on
off
off
20
20
on
off
on
off
on
21
21
on
off
on
on
off
22
22
on
off
on
on
on
23
23
on
on
off
off
off
24
24
on
on
off
off
on
25
25
on
on
off
on
on
27
27
on
on
on
off
off
28
28
on
on
on
off
on
29
29
on
on
on
on
off
30
30
on
on
on
on
on
0
31
Table 2.2: Configuration Switch Address Settings
TEST MODE
The STM-100 / MF incorporates a test and deposition simulation mode to
aid in trouble shooting and demonstrating the instrument. This mode simulates
a deposition rate of 16 Angstroms per second with a Density and Z-Factor of 1
and Tooling of 100%. The test mode may be activated only in the non-
program mode. Holding the UP ARROW key down while activating the
SHUTTER CLOSE key will turn the test mode on. The Å/S and KÅ legends
will blink continuously to indicate the test function. Once in the test mode the
SECTION 2.6
Enabling the Test
Mode
Page 2 - 11
OPERATION AND PROGRAMMING