Atec Agilent-J2300E - Manual (Page 21)

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UTP155
Average utilization in %
Instantaneous utilization in %
Maximum utilization %
Total cells
Idle/unassigned cells
Busy (assigned) cells
Header (“HEC”) errors
Line code violations
MS-REI/REI-L (Line FEBE)
REI/REI-P (Path FEBE)
MS-AIS/AIS-L
AIS/AIS-P
Loss of Cell Delineation (LCD)
ATM25
Average utilization in %
Instantaneous utilization in %
Maximum utilization %
Total cells received
Idle/unassigned cells received
Busy (assigned) cells received
Header (“HEC”) errors
E3
Average utilization in %
Instantaneous utilization in %
Maximum utilization %
Total cells received
Idle/unassigned cells received
Busy (assigned) cells received
Header (“HEC”) errors received
Code violations
REI (FEBE)
RDI (FERF)
BIP-8
Label mismatches
T3/DS3
Average utilization in %
Instantaneous utilization in %
Maximum utilization %
Total cells received
Idle cells received
Busy cells received
HEC errors received
Line code violations
DS3 FEBE
P1/P2 parity
C-bit parity
PLCP BIP8
PLCP FEBE
STM-1/STM-1e/OC-3/EC-3
Average utilization in %
Instantaneous utilization in %
Maximum utilization %
Total cells received
Idle/unassigned cells received
Busy (assigned) cells received
Header (“HEC”) errors received
Line code violations
MS-REI/REI-L (Line FEBE)
REI/REI-P (Path FEBE)
MS-AIS/AIS-L
AIS/AIS-P
Loss of Cell Delineation (LCD)
STM-4/OC-12
Auto-discovery of up to 4,095 VCs
Instantaneous utilization in % per VC
Peak % of total bandwidth per VC
Total cells received per VC
Header (“HEC”) errors received
ATM Testing (continued)