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Atm testing – Atec Agilent-J2300E User Manual

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UTP155

Loss of signal (LOS)(*)

Loss of frame (LOF)(*)

Loss of pointer (LOP)

B1, B2, B3 BIP errors

Summary BIP error (*)

Label mismatch

MS-REI/REI-L (Line FEBE)

REI/REI-P (Path FEBE)

MS-RDI/RDI-L (Line FERF) (*)

MS-AIS/AIS-L (*)

RDI/RDI-P (Yellow)

AIS/AIS-P

Summary Far End (*)

Loss of Cell Delineation (LCD) (*)

Remote

STM-4c/OC-12

Loss of Signal (LOS)

Loss of Frame (LOF)

Loss of Pointer (LOP)

Out of Frame (OOF)

MS-RDI/RDI-L (Line/FERF)

MS-AIS/AIS-L

RDI/ RDI-P (Yellow)

AIS/AIS-P

MS-REI/REI-L (Line FEBE) and counts

REI/REI-P (Path FEBE) and counts

Label mismatch

Loss of Cell Delineation (LCD)

B1, B2, B3 BIP error counts

BIP error indication

Optical power (Using STM-1/OC-3

module)

ATM Network Vitals

Vitals provides real-time statistics of network conditions that provide a

statistical picture of what is happening on the ATM links. Working

simultaneously with decodes, filters, and other measurements, the Vitals

feature interprets data traffic as it occurs. This feature can be used to identify

network problems or to assist the user in optimizing the configuration of

network components and software.

Values in the Vitals display are presented in tabular form and are cumulative

from the start of a test. An exception is instantaneous utilization, which is also

displayed in graphical format for a quick look at overall usage of the network.

Vitals data are provided for both the network and the subscriber sides of the

connection.

T1/DS1

Average utilization in %

Instantaneous utilization in %

Maximum utilization %

Total cells received

Idle cells received

Busy cells received

HEC errors received

Bi-polar violations

ESF CRC errors

Frame slips

Frame bits

One’s density

Excess zero’s

E1

Average utilization in %

Instantaneous utilization in %

Maximum utilization %

Total cells received

Idle cells received

Busy cells received

J2

Average utilization in %

Instantaneous utilization in %

Maximum utilization %

Total cells received

Idle cells received

Busy cells received

HEC errors

Line code violations

CRC-45 errors

HEC errors

Code violations

CRC-4 errors

Frame alignment errors

ATM Testing

(continued)