AMETEK MX CTSL - Manual (Page 106)

User Manual
California Instruments
9.3 Test Sequence
The test sequence implemented
commonly found phenomena
product for immunity from such fluctuations.
Voltage fluctuations are applied at different levels
the product class and select the
specified by the selected test
The test sequence can be programmed
change from the nominal voltage in %, the number of
periods) and the delay between
repeated 1 or more times. (A Delay of
data setup are shown in the figure
data entry grid:
Unom (%) Test Level
100
Note that the sequence of voltage
100 % Unom, the voltage changes
level (%) is set to a negative value
These parameters can be entered
test class, select the File, Open menu.
C:\Program Files\California Instruments
The following four EN 61000-4
File Name
Generic IEC 1000-4-14 Test Class
Generic IEC 1000-4-14 Test Class
The user may create as many
using the File, Save As… menu entry.
MX-CTSL
Revision H
implemented by this test consists of a series of voltage fluctuations
on the public utility power grid. The objective of this test is to evaluate
product for immunity from such fluctuations.
Voltage fluctuations are applied at different levels for different product categories.
the appropriate test level. During the test run, voltage
mode and for specified periods of time.
programmed by setting the nominal voltage in %, the test level which is the
change from the nominal voltage in %, the number of times each test level repeats
between each set of test levels. Finally, each step in the
or more times. (A Delay of 1 means the set it only run once.) The various
figure below. In this example, the following parameters
Level (%) Level Repeat Delay
8 3 60
Figure 9-2: EN 61000-4-14 Test Sequence
voltage changes is different if the Unom is at 100 %
changes occur in both positive and negative directions (alternating).
value and Unom is 100 %, the voltage changes are
entered on screen by the operator or loaded from disk.
pen menu. The default location for IEC test files is:
Instruments\Mxgui\IEC_Test
4-14 test files are distributed with the MXGUI program:
Class 2.414_Fluc
Class 3.414_Fluc
many test files as desired using the data entry grid. Changes
s… menu entry.
CTSL Compliance Test System
103
fluctuations consistent with
objective of this test is to evaluate a
categories. The user must determine
voltage changes are applied as
nominal voltage in %, the test level which is the
repeats (consecutive 5 second
the sequence data grid can be
various columns in the test
parameters were specified in the
Repeat
1
than at any other value. At
negative directions (alternating). If the test
are reversed.
disk. To load a new test or
The default location for IEC test files is:
program:
Test Class
Class 2
Class 3
Changes made can be saved