Device_run_test_idle, Usage, Options – Altera Quartus II Scripting User Manual
Page 281: Description, Example, Device_run_test_idle –151

Chapter 3: Tcl Packages & Commands
3–151
jtag
© July 2013
Altera Corporation
Quartus II Scripting Reference Manual
device_run_test_idle
Usage
device_run_test_idle [-num_clocks
Options
-num_clocks
through. If not specified, this value is 1
Description
Drive the JTAG controller into the Run_Test_Idle state for a number cycles specified with the -num_clocks
option.
The device must be locked before you can perform this operation.
Example
# List all available programming hardware, and select the USB-Blaster.
# (Note: this example assumes only one USB-Blaster is connected.)
puts "Programming Hardware:"
foreach hardware_name [get_hardware_names] {
puts $hardware_name
if { [string match "USB-Blaster*" $hardware_name] } {
set usbblaster_name $hardware_name
}
}
puts "\nSelect JTAG chain connected to $usbblaster_name.\n";
# List all devices on the chain, and select the first device on the
# chain.
puts "\nDevices on the JTAG chain:"
foreach device_name [get_device_names -hardware_name $usbblaster_name] {
puts $device_name
if { [string match "@1*" $device_name] } {
set test_device $device_name
}
}
puts "\nSelect device: $test_device.\n";
# Open device
open_device -hardware_name $usbblaster_name -device_name $test_device
# Retrieve device id code.
# IDCODE instruction value is 6; The ID code is 32 bits long.
# IR and DR shift should be locked together to ensure that other
# applications
# will not change the instruction register before the id code value is
# shifted
# out while the instruction register is still holding the IDCODE
# instruction.
device_lock -timeout 10000
device_ir_shift -ir_value 6 -no_captured_ir_value
puts "IDCODE: 0x[device_dr_shift -length 32 -value_in_hex]"
# Goto the Run_Test_Idle state and stay there for 8 cycles.
device_run_test_idle -num_clocks 8
device_unlock
# Close device
close_device