Metrohm 757 VA Computrace User Manual
757 va computrace, 01x0
Table of contents
Document Outline
- Title page
- Table of contents
- 1 Introduction
- 2 Main window
- 3 General settings for exploratory and determination mode
- 4 Exploratory mode
- 5 Determination mode
- 5.1 Determination mode overview
- 5.2 Working method specifications
- 5.3 Monitor
- 5.4 Determination curves
- Load/save determinations
- Copy parameters to working method
- Determination curves window
- Edit determination method parameters
- Specifications
- Determination
- Voltammetric
- Substances
- Calculations
- Edit addition parameters
- Edit baseline
- Zooming
- Auto scaling
- Swap axis
- Show baselines
- Show unknown peaks
- Graphical properties for determination curves
- Graphical properties for calibration curves
- Copy/export graphics
- 5.5 Results
- 5.6 Sample table
- 5.7 Printing in determination mode
- 5.8 Data processing and evaluation
- Data transfer
- Data acquisition
- Background compensation
- Smoothing and differentiation
- Peak recognition
- Baseline calculation
- Evaluation quantity calculation
- Content calculation
- Dilution calculation
- Standard addition calculation
- Rules for standard addition
- Calibration curve calculation
- Rules for calibration curves
- Formula calculation
- 6 Manual control
- 7 How to ...?
- 8 Troubleshooting
- 8.1 General procedure for error messages
- 8.2 Connection problems
- 8.3 Software problems
- 8.4 Dosimat problems
- 8.5 General rules for VA trace analysis
- 8.6 Voltammetric problems
- Low background current or unstable baseline
- Curves with high noise
- Standard addition curves are not reproducible
- Peak displacement
- No peak found
- Peak is in the highest uA range
- Double peak
- Standard addition peaks displaced
- No addition
- Spikes / signal jump in voltammogram
- Oxygen interference
- Unsuitable bridging electrolyte in the reference electrode
- Overcharging of the working electrode
- Disturbances at the HMDE through gas formation
- Complex formation
- Peak on highly curved baseline
- Peak overlapping
- Calibration with chemically non-isoformal standards
- Software license
- Index