Seaward ClareHAL - Manual (Page 33)

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The second column holds the ttest ramp profile ttimes (3 fields) for
completing a level of test sequence:
Time up or Ramp Time (to terminal voltage)
Time Hold (for the test at terminal voltage)
Time Down (for final terminal voltage)
The third column indicates the tterminal voltage (corresponds to Time
up) that the test should ramp to after the ramp up time is reached, and
the second voltage (corresponds to Time Down) is the ffinal termination
voltage (usually 0.00KV). But this value can be selected to be
“Maintained” to sustain the terminal voltage for execution to the next
level of test sequence after the first test time sequence has completed.
This is done by highlighting the Time Down, press Rotate Field and
select “Maintained” using encoder.
The fourth column holds the lleakage limit values, low (top) and high
(bottom) respectively. A low value is used to ensure that the EUT is
correctly connected.
Next the icon (a lightning flash with a number) denotes the A Arc level for
the test. A level of 1 is the most sensitive to arcs, with 9 the least
sensitive, and X disables the feature.
The circular icon with a number in the centre denotes the number of
repeats (loops) for the test. This icon can be joined to other levels of
test sequence for different combinations of loops cycle for different
unique test sequences, see e.g. below
(Fig. A) (Fig. B)
Fig. A shows that the first test sequence (50Hz Hipot test) will convene
twice before going on to the second test sequence (60Hz Hipot test) for
twice. Where as,
Fig. B shows that the first test sequence (50Hz Hipot test) will convene
once then proceeds to second test sequence (60Hz Hipot test) once
and then the process is repeat again once through.
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