Rockwell Automation DeviceNet SEMINAR LAB EX - Manual (Page 68)

68 DeviceNet Seminar Lab Exercises
Publication 1787.6.1 - August 1997
You see this screen.
Notice that all bits between N152:0, bit 0, and N152:3, bit 15, are 0s.
These 64 bits are the device failure bits forming a bitmask with each bit
representing a node between 0 and 63 decimal.
3. Disconnect the photoeye’s drop line from the trunk line.
You see this screen.
Verify that N152:0, bit 7, changes to a 1. Notice that 72 and 07 are
alternatively flashing on the node address display of the scanner. The net
status indicator flashes red indicating that station 07 has failed.
4. Reconnect the photoeye’s drop line from the trunk line.
Notice that bit 7 goes back to 0 and the scanner display returns to 00.
5. Close the Data File.