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Corrected system performance, System dynamic range 1 – Atec Agilent-E8364C User Manual

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5

E8362/3/4C

Corrected system performance

continued

1. The system dynamic range is calculated as the difference between the noise floor
and the source maximum output power. System dynamic range is a specification

when the source is set to port 1, and a characteristic when the source is set to

port 2. The effective dynamic range must take measurement uncertainties and

interfering signals into account.

2. The test port system dynamic range is calculated as the difference between the

test port noise floor and the source maximum output power. The effective dynamic

range must take measurement uncertainties and interfering signals into account.
3. The direct receiver access input system dynamic range is calculated as the

difference between the direct receiver access input noise floor and the source

maximum output power. The effective dynamic range must take measurement

uncertainties

and

interfering signals into account. This set-up should only be used

when the receiver input will never exceed its damage level. When the analyzer is

in segment sweep mode, the analyzer can have pre-defined frequency segments

which will output a higher power level when the extended dynamic range is

required (i.e. devices with high insertion loss), and reduced power when receiver

damage may occur (i.e. devices with low insertion loss). The extended range is

only available in one-path transmission measurements.

4. Typical performance.
5. May be limited to 100 dB at particular frequencies below 500 MHz due to spurious

receiver residuals. Methods are available to regain the full dynamic range.

6. E8362C only: Option H11 decreases value by 1 dB.
7. E8362C only: Option H11 decreases value by 2 dB.

System dynamic range 1

Description

Specification (dB)

Typical (dB) at direct

Supplemental information

at test port

2

receiver access input

3

Dynamic range

Standard configuration and extended power range and bias-tees (E8362/3/4C-Option UNL)

10 to 45 MHz

4

79 N/A

45 to 500 MHz

5

92

N/A

500 MHz to 2 GHz

117

N/A

2 to 10 GHz

120

N/A

10 to 20 GHz

121

N/A

20 to 30 GHz

112

N/A

30 to 40 GHz

108

N/A

Option 016 degrades

40 to 45 GHz

105

N/A

performance by 2 dB

45 to 50 GHz

99

N/A

Configurable test set and extended power range and bias-tees

(E8362/3/4C-Option UNL and Option 014)

10 to 45 MHz

4

79 129

45 to 500 MHz

5, 6

92

130

500 MHz to 2 GHz

6

117

136

2 to 10 GHz

6

120

135

10 to 20 GHz

7

119

134

20 to 30 GHz

109

121

30 to 40 GHz

105

117

Option 016 degrades

40 to 45 GHz

101

112

performance by 2 dB

45 to 50 GHz

95

106