AMETEK MX CTSH - Manual (Page 88)

California Instruments Revision H 88
User Manual MX Series CTSH Compliance Test System
7.4 Specifying test sequences for Dips and Variations
The EN 61000-4-11 test suite consists of two types of tests:
Dips and Interruptions Simulates short interruptions in AC supply
Voltage Variations Simulates slow changes in AC supply
The user must select the desired test type before executing the test. Since both test types require a number
of test parameters, the test sequence
parameters must be entered in the data
entry
grid or loaded from disk using the File, Open
menu entry.
Note that the EN 61000-4-11 specification is
based on common types of AC line
disturbances found on the European utility
network. The test voltage levels and dip
durations required to perform an EN 61000-
4-11 tests is not uniquely defined. Instead,
different test levels and durations are
allowed for various product categories.
Figure 7-2: EN 61000-4-11 Voltage Variation
specification – Edition 1.0
Product committees set these test levels. For this reason, the test parameters used by the MXGUI for the
EN 61000-4-11 test sequences can be specified by the user or loaded from disk. This allows unlimited
customization of both voltage interruptions and voltage variations tests. Up to 100 sequences of voltage
dips at various levels, phase angles and duration can be specified. Voltage variations can be defined by
level, rise time, fall time and hold time. Refer to Figure 7-2 and Figure 7-3 for an illustration of how these
parameters affect the V RMS output under the different standard revisions.
Figure 7-3: EN 61000-4-11 Voltage Variation specification
– Edition 2.0