Rainbow Electronics AT83C26 - Manual (Page 71)

71
7511B–SCR–10/05
AT83C26
t
F
Fall time 100
μ
s
C
L
= 30pF Class A
C
L
= 30pF Class B
C
L
= 30pF Class C
Table 60. Smart Card n I/Os (CIOn, CC4n, CC8n, CRSTn) (n =1, 2, 3, 4, 5) (Continued)
Symbol Parameter Min Typ Max Unit Test Conditions
Table 61. Card Presence (CPRES1, CPRES2)
Symbol Parameter Min Typ Max Unit Test Conditions
I
OL1
CPRES1 weak pull-up output current 3 10 25 µA
Short to VSS
PULLUP1 = 1:
Internal pull-up active
R
CPRES2
CPRES2 weak pull-up output current 3 10 25 µA
Short to VSS
PULLUP2 = 1:
Internal pull-up active
Table 62. DCDCB
Symbol Parameter Min Typ Max Unit Test Conditions
CVCCB DCDCB output voltage
4.9
3
2
5.3
3.35
2.4
V
Load = 70mA
Load = 40mA
Load = 10mA
Ripple on CVCCB 200 mV
Vcardok up Vdcbok high level threshold
5.3
3.35
2.4
V
Class A
Class B
Class C
Vcardok
down
Vdcbok low level threshold
4.9
3.1
2.1
V
Class A
Class B
Class C
T
VHL
VDCB valid to 0 100 500
μ
s
T
VLH
VDCB 0 to valid 1000 4000
μ
s
Table 63. Slew rate on CIOn with CVCCn= 5V (n=1, 2, 3, 4, 5), Mode 1
Symbol Parameter Min Typ Max Unit Test Conditions
t
R/F
Rise time/ Fall time
with
CIOn_SLEW_CTRL[1-0] = 00 (5V)
or CIOn_SLEW_CTRL[1-0] = 11(mode auto)
12 ns
t
R
Rise time
with
CIOn_SLEW_CTRL[1-0] = 01 (3V)
7 ns
t
R
Rise time
with
CIOn_SLEW_CTRL[1-0] = 10 (1.8V)
2.7 ns