Diagnostic test descriptions – Dell Broadcom NetXtreme Family of Adapters User Manual
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User Diagnostics: Broadcom Broadcom NetXtreme BCM57XX User Guide
file:///C|/Users/Nalina_N_S/Documents/NetXtreme/English/dosdiag.htm[9/5/2014 3:32:22 PM]
setmba
setmba -e 2
= Enable Boot Protocol (BootP) MBA
setmba -s 0
= Auto speed and duplex (default)
setmba -s 1
= 10 Mbps speed, half-duplex operation
setmba -s 2
= 10 Mbps speed, full-duplex operation
setmba -s 3
= 100 Mbps speed, half-duplex operation
setmba -s 4
= 100 Mbps speed, full-duplex operation
setmba -s 6
= 1000 Mbps full-duplex (fiber)
nictest
Runs the specified diagnostic tests
Specify which individual test(s) within a group or which group(s) of tests to run by including the test designation
or group designation in the command string, as shown in the examples below:
nictest abcd
= Run all tests
nictest b
= Run all tests in group B
nictest a3b1
= Run tests A3 and B1 only
nictest a124b2
= Run tests A1, A2, A4, and B2
exit
Changes from the Broadcom CLI mode to the MS-DOS command prompt mode
device
Selects the device (adapter)
device -n<
hex> = Device number in hexadecimal notation (default = 00000000)
device -r
= Remove all current Broadcom adapters and rescan available adapters
device -s
= Silent mode (adapters are not displayed)
version
Displays the version of the adapter software
help
Displays this list of commands
reset
Resets the Broadcom NetXtreme Gigabit Ethernet chip
reset -c
= Simulate a cold reset
reset -w<
ms> = Wait for firmware signature, in milliseconds.
reset -t
= Display the time from reset to firmware invert signature
cls
Clears the screen
asfprg
Loads Alert Standard Format (ASF) into NVRAM
Do not use. Alert Standard Format (ASF) is not for system platforms.
Diagnostic Test Descriptions
The diagnostic tests are divided into 4 groups: Register Tests (Group A), Memory Tests (Group B), Miscellaneous Tests (Group
C), and Driver Associated Tests (Group D). The diagnostic tests are listed and described in
.
Table 3: Diagnostic Tests
Test
Description
Number Name
Group A: Register Tests
A1
Indirect
Register
This test uses an indirect addressing method to write an increment of data to the MAC hash register
table and read back data for verification. The memory read/write is done 100 times while
incrementing test data.
A2
Control
Register
Each register specified in the configuration content defines the read-only bit and the read/write bits.
The test writes 0s and 1s to the test bits to ensure the read-only bits are not changed, and that
read/write bits are changed.
This test attempts to read the register configuration file (Ctrlreg.txt) for the register definitions. If
the file does not exist, a default register offset and mask bits are used.
Offset Read-Only Mask Read/Write Mask
0x00000400 0x00000000 0x007FFF8C
0x00000404 0x03800107 0x00000000
A3
Interrupt
This test verifies the interrupt functionality. It enables an interrupt and waits 500 ms for the
interrupt to occur and reports an error if it cannot generate the interrupt.
A4
Built-In Self-
Test
This is the hardware built-in self-test (BIST).
A5
PCI Cfg
Register
This test verifies the access integrity of the PCI configuration registers.
Group B: Memory Tests
This test tests the onboard scratchpad SRAM. The following tests are performed:
Address Test. This test writes each address with a unique increment of data and reads back data
to ensure data is correct. After filling the entire address with the unique data, the program reads
back the data again to ensure that the data is still correct.