0 ac characteristics, 1 ac test conditions, 2 device capacitance – Samsung FLEX-MUXONENAND KFN8GH6Q4M User Manual
Page 110: 3 valid block characteristics, Flex-muxonenand4g(kfm4gh6q4m-debx), 1 ac test conditions 5.2 device capacitance, Capacitance
Flex-MuxOneNAND4G(KFM4GH6Q4M-DEBx)
- 110 -
FLASH MEMORY
Flex-MuxOneNAND8G(KFN8GH6Q4M-DEBx)
Flex-MuxOneNAND16G(KFKAGH6Q4M-DEBx)
5.0 AC CHARACTERISTICS
5.1 AC Test Conditions
5.2 Device Capacitance
CAPACITANCE
(T
A
= 25
°C, V
CC
= 1.8V, f = 1.0MHz)
NOTE :
1) Capacitance is periodically sampled and not 100% tested.
5.3 Valid Block Characteristics
NOTE :
1) The
device
may include invalid blocks when first shipped. Additional invalid blocks may develop while being used. The number of valid blocks is presented with
both cases of invalid blocks considered. Invalid blocks are defined as blocks that contain five or more bad bits which cause status failure during Program and
Erase operation
.
Do not erase or program factory-marked bad blocks.
2) The 1st block, which is placed on 00h block address, is guaranteed to be a valid block up to 1K program/erase cycles with 4bit/528Byte ECC.
Parameter
Value (66MHz)
Value (83MHz)
Input Pulse Levels
0V to V
CC
0V to V
CC
Input Rise and Fall Times
CLK
3ns
2ns
other inputs
5ns
2ns
Input and Output Timing Levels
V
CC
/2
V
CC
/2
Output Load
C
L
= 30pF
C
L
= 30pF
Item
Symbol
Test Condition
Single
DDP
QDP
Unit
Min
Max
Min
Max
Min
Max
Input Capacitance
C
IN1
V
IN
=0V
-
10
-
20
-
40
pF
Control Pin Capacitance
C
IN2
V
IN
=0V
-
10
-
20
-
40
Output Capacitance
C
OUT
V
OUT
=0V
-
10
-
20
-
40
INT Capacitance
C
INT
V
OUT
=0V
-
10
-
20
-
40
Parameter
Symbol
Min
Typ.
Max
Unit
Valid Block Number
Single
N
VB
998
-
1024
Blocks
DDP
1996
-
2048
QDP
3993
-
4096
0V
V
CC
V
CC
/2
V
CC
/2
Input Pulse and Test Point
Input & Output
Test Point
Output Load
Device
Under
Test
* C
L
= 30pF including scope
and Jig capacitance