Sun Microsystems 220R - Manual (Page 198)

Test Function
line_walk1
Performs walk-one test on interrupt line.
pin_test
Verifies that the interrupt pin is logic-level high (1) after reset.
The following example shows the PCI / Cheerio diagnostic output message.
Enter (0-11 tests, 12 -Quit, 13 -Menu) ===> 0
Test
vendor_ID_test
device_ID_test
mixmode_read
e2_class_test
status_reg_walk1
line_size_walk1
latency_walk1
line_walk1
pin_test
SUBTEST=’pin_test’
Enter (0-11 tests, 12 -Quit, 13 -Menu) ===>
7.6.4 EBus DMA/TCR Registers
The EBus DMA/TCR registers diagnostic performs the following tests.
Test Function
DMA_reg_test
Performs a walking ones bit test for control status register, address
register, and byte count register of each channel. Verifies that the control
status register is set properly.
DMA_func_test
Validates the DMA capabilities and FIFOs. Test is executed in a DMA
diagnostic loopback mode. Initializes the data of transmitting memory
with its address, performs a DMA read and write, and verifies that the
data received is correct. Repeats for four channels.
The following example shows the EBus DMA/TCR registers diagnostic output
message.
198 Sun Enterprise 220R Server Service Manual
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January 2000, Revision A