Headphone output power characteristics, Figure 3. headphone output test load, Figure 3.headphone output test load – Cirrus Logic CS42L51 User Manual
Page 19: Figure 3, Note 8), Note 9), Note 10), Note 11), Cs42l51 headphone output power characteristics

DS679F1
19
CS42L51
HEADPHONE OUTPUT POWER CHARACTERISTICS
Test conditions (unless otherwise specified): Input test signal is a full-scale 997 Hz sine wave; measurement band-
width is 10 Hz to 20 kHz; Sample Frequency = 48 kHz; test load R
L
= 16
Ω, C
L
= 10 pF (see
).
8.
One-half LSB of triangular PDF dither is added to data.
9.
Full-scale output voltage and power is determined by the gain setting, G, in register
Gain (HP_GAIN[2:0])” on page 57
. High gain settings at certain VA and VA_HP supply levels may
cause clipping when the audio signal approaches full-scale, maximum power output, as shown in
.
. R
L
and C
L
reflect the recommended minimum resistance and maximum capacitance re-
quired for the internal op-amp's stability and signal integrity. In this circuit topology, C
L
will effectively
move the band-limiting pole of the amp in the output stage. Increasing this value beyond the recom-
mended 150 pF can cause the internal op-amp to become unstable.
11. VA_HP settings lower than VA reduces the headroom of the headphone amplifier. As a result, the DAC
may not achieve the full THD+N performance at full-scale output voltage and power.
Parameter
VA = 2.5V (nominal)
Min Typ Max
VA = 1.8V (nominal)
Min Typ Max
Unit
AOUTx Power Into R
L
= 16
Ω
HP_GAIN[2:0]
Analog
Gain (G)
VA_HP
000
0.3959
1.8 V
-
14
-
-
7
-
mW
rms
2.5 V
-
14
-
-
7
-
mW
rms
001
0.4571
1.8 V
-
19
-
-
10
-
mW
rms
2.5 V
-
19
-
-
10
-
mW
rms
010
0.5111
1.8 V
-
23
-
-
12
-
mW
rms
2.5 V
-
23
-
-
12
-
mW
rms
011 (default)
0.6047
1.8 V
-
17
-
mW
rms
2.5 V
-
32
-
-
17
-
mW
rms
100
0.7099
1.8 V
-
23
-
mW
rms
2.5 V
-
44
-
-
23
-
mW
rms
101
0.8399
1.8 V
mW
rms
2.5 V
-
32
-
mW
rms
110
1.0000
1.8 V
(Note
mW
rms
2.5 V
mW
rms
111
1.1430
1.8 V
mW
rms
2.5 V
mW
rms
AOUTx
AGND
R
L
C
L
0.022
µF
51
Ω
Figure 3. Headphone Output Test Load