HT instruments SIRIUS89N User Manual
Page 28
SIRIUS89N
EN - 26
6.3.1. Tripping times for the general and selective RCDs
Table of tripping times for I
∆N
x1, I
∆N
x2, I
∆N
x5 and AUTO tests.
If the parameters set on the instrument comply with the type of RCD under test (and
if the latter works properly) the test
x1, x2, x5 SHALL cause the RCD tripping within
the times shown in the following table:
RCD type
I
∆N
x 1
I
∆N
x 2
I
∆N
x 5
Description
General 0.3s
0.15s
0.04s
Max tripping time in seconds
0.5s 0.20s 0.15s
Max tripping time in seconds
Selective
S
0.13s 0.05s 0.05s
Minimum tripping time in seconds
* For rated values I
∆N ≤ 30mA the test current at five times is 0.25A.
For currents equal to ½
I
∆N
the RCD shall not trip in any case.
Table 3:
Table of tripping times for tests with leakage currents I
∆N
x1, I
∆N
x2, I
∆N
x5 and AUTO.
Table of tripping times for ramp tests " ".
This test is not used to be effected to compare the RCD tripping time at the tripping
current, while the standards refer to the maximum tripping times in case the RCD is
checked with a leakage current equal to the rated current.
The limits value for the tripping current are indicated in the following Table:
RCD Type
I
∆N
≤ 10mA
I
∆N
>
10mA
A
1,4 x I
∆N
1,4 x I
∆N
AC
I
∆N
I
∆N
Table 4:
Current limit value for "Ramp" Test