Atec Agilent-E8361A - Manual (Page 56)

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Microwave PNA Series
System capabilities
Familiar graphical user interface
The PNA Series employs a graphical user interface
based on Windows 2000. There are two fundamental
ways to operate the instrument manually: you can use
a hardkey interface, or use drop-down menus driven
from a mouse (or another standard USB pointing
device). Hardkey navigation brings up active toolbars
that perform most of the operations required to
configure and view measurements. Front-panel
navigation keys allow for use of the instrument
without a mouse. In addition, mouse-driven pull-
down menus provide easy access to both standard and
advanced features. Both methods employ dialog boxes
to display all the choices needed to make measurement
set-ups.
Built-in information system
Embedded documentation provides measurement
assistance in five different languages (English, Chinese,
French, German, Japanese, and Spanish). A thorough
index of help topics and context-sensitive help is
available from dialog boxes.
Limit lines
Define test limit lines that appear on the display for go/
no go testing. Lines may be any combination of
horizontal, sloping lines, or discrete data points.
Time-domain (Option 010)
With the time-domain option, data from transmission
or reflection measurements in the frequency domain
are converted to the time domain using a Fourier
transformation technique (chirp Z) and presented
on the display. The time-domain response shows the
measured parameter value versus time. Markers may
also be displayed in electrical length (or physical length
if the relative propagation velocity is entered).
Time stimulus modes
Two types of time excitation stimulus waveforms can
be simulated during the transformations, a step and
an impulse.
Low-pass step
This stimulus, similar to a traditional time-domain
reflectometer (TDR) stimulus waveform, is used to
measure low-pass devices. The frequency-domain data
should extend from DC (extrapolated value) to a higher
value. The step response is typically used for reflection
measurements only.
Low-pass impulse
This stimulus is also used to measure low-pass devices.
The impulse response can be used for reflection or
transmission measurements.
Bandpass impulse
The bandpass impulse stimulates a pulsed RF signal
(with an impulse envelope) and is used to measure the
time-domain response of band-limited devices. The start
and stop frequencies are selectable by the user to any
values within the limits of the test set used. Bandpass
time-domain responses are useful for both reflection
and transmission measurements.
Time-domain range
The "alias-free" range over which the display is free
of response repetition depends on the frequency span
and the number of points. Range, in nanoseconds, is
determined by:
Time-domain range =
(number of points - 1)/frequency span [in GHz]
Range resolution
The time resolution of a time-domain response is
related to range as follows:
Range resolution =
time span/(number of points - 1)
Windows
The windowing function can be used to modify
(filter) the frequency-domain data and thereby reduce
over-shoot and ringing in the time-domain response.
Kaiser Beta windows are available.
Gating
The gating function can be used to selectively remove
reflection or transmission time-domain responses. In
converting back to the frequency-domain the effects of
the responses outside the gate are removed.
Configurable test set (Option 014)
With the configurable test set option, front panel
access loops are provided to the signal path between
the source output and coupler input.
Extended dynamic range configuration
Reverse the signal path in the coupler and bypass the
loss typically associated with the coupled arm. Change
the port 2 switch and coupler jumper configurations to
increase the forward measurement dynamic range. When
making full two-port error corrected measurements, the
reverse dynamic range is degraded by 12 to 15 dB.
High power measurement configuration
Add external power amplifier(s) between the source
output and coupler input to provide up to +30 dBm
of power at the test port(s). Full two-port error
correction measurements possible. When the DUT
output is expected to be greater than +30 dBm, measure
directly at the B input and use an external fixed or
step attenuator to prevent damage to the receiver.
For measurements greater than +30 dBm, add external
components such as couplers, attenuators, and isolators.