Atec Agilent-E8361A - Manual (Page 17)

17
E8362/3/4B
Test port input
continued
Description Specification Supplemental information
Standard 014 UNL UNL and 014
Trace noise magnitude
10 to 5 MHz 1 < 0.050 dB rms
5 to 500 MHz < 0.010 dB rms 1 kHz IF bandwidth
500 MHz to 0 GHz < 0.006 dB rms Ratio measurement, nominal
0 to 0 GHz < 0.006 dB rms power at test port
0 to 50 GHz < 0.006 dB rms
Trace noise magnitude – Option 080 enabled 1, 4
10 to 5 MHz 1 < 0.060 dB rms
5 to 500 MHz < 0.010 dB rms 1 kHz IF bandwidth
500 MHz to 0 GHz < 0.006 dB rms Ratio measurement, nominal
0 to 0 GHz < 0.007 dB rms power at test port
0 to 50 GHz < 0.008 dB rms
Trace noise phase
10 to 5 MHz 1 < 0.50° rms
5 to 500 MHz < 0.100° rms 1 kHz IF bandwidth
500 MHz to 0 GHz < 0.060° rms Ratio measurement, nominal
0 to 0 GHz < 0.100° rms power at test port
0 to 50 GHz < 0.100° rms
Trace noise phase – Option 080 enabled 1, 4
10 to 5 MHz 1 < 0.50° rms
5 to 500 MHz < 0.100° rms 1 kHz IF bandwidth
500 MHz to 0 GHz < 0.060° rms Ratio measurement, nominal
0 to 0 GHz < 0.100° rms power at test port
0 to 50 GHz < 0.100° rms
Reference level magnitude
Range ±00 dB ±00 dB ±00 dB ±00 dB
Resolution 0.001 dB 0.001 dB 0.001 dB 0.001 dB
Reference level phase
Range ±500° ±500° ±500° ±500°
Resolution 0.01° 0.01° 0.01° 0.01°
Stability magnitude 3 Typical ratio measurement:
Measured at the test port
10 to 5 MHz ±0.05 dB/°C
5 MHz to 0 GHz ±0.0 dB/°C
0 to 0 GHz ±0.0 dB/°C
0 to 50 GHz ±0.0 dB/°C
Stability phase 3 Typical ratio measurement:
Measured at the test port
10 to 5 MHz ±0.5°/°C
5 MHz to 0 GHz ±0.°/°C
0 to 0 GHz ±0.5°/°C
0 to 50 GHz ±0.8°/°C
Damage input level
Test port 1 and 0 dBm or ±0 VDC, typical
R1, R in 15 dBm or ±15 VDC, typical
A, B in 15 dBm or ±15 VDC, typical
Coupler thru (Option 01 or UNL and 01) 0 dBm or ±0 VDC, typical
Coupler arm (Option 01 or UNL and 01) 0 dBm or ±7 VDC, typical
Source out (reference) 0 dBm or ±15 VDC, typical
Source out (test ports) 0 dBm or 0 VDC, typical
1. Typical performance.
. Trace noise magnitude may be degraded to 0 mdB rms at harmonic frequencies
of the first IF (8. MHz) below 80 MHz.
. Stability is defined as a ratio measurement measured at the test port.
. 0 Hz offset.