Avago Technologies LSI53C140 - Manual (Page 46)

3-12 LSI53C140 Specifications
Ver. 2.1 Copyright © 1998–2001 by LSI Logic Corporation. All rights reserved.
Table 3.6 Operating Conditions
1
1. Conditions that exceed the operating limits may cause the device to function
incorrectly.
Symbol Parameter Min Max Unit Test Conditions
V
DD
Supply voltage 3.13 3.47 V –
I
DD
Supply current
(dynamic SE) – 130 mA –
I
DD-I/O
Supply current
(dynamic LVD) – 600 mA –
I
DD
Supply current (static) – 1 mA –
T
A
Operating free air 0 70 ˚C –
θ
JA
2
2. Value for QFP package.
Thermal resistance
(junction to ambient air) – 35 ˚C/W –
θ
JA
3
3. Value for BGA package.
Thermal resistance
(junction to ambient air) – 20.4 ˚C/W Zero airflow
Table 3.7 LVD Driver SCSI Signals—A_SD[15:0]
±
, A_SDP[1:0]
±
,
A_SCD
,
A_SIO
± ,
A_SMSG
±
, A_SREQ
±
, A_SACK
±
,
A_SBSY
±
, A_SATN
±
, A_SSEL
±
, A_SRST
±
, B_SD[15:0]
±
,
B_SDP[1:0]
±
, B_SCD
,
B_SIO
± ,
B_SMSG
±
, B_SREQ
±
,
B_SACK
±
, B_SBSY
±
, B_SATN
±
, B_SSEL
±
, B_SRST
± 1
1. V
CM
= 0.7–1.8 V, R
L
= 0–110
Ω,
R
bias
= 9.76 k
Ω.
Symbol Parameter Min Max Units Test Conditions
I
O
+ Source (+) current 7 12 mA Asserted state
I
O
−
Sink (
−
) current
−
7
−
12 mA Asserted state
I
O
+ Source (+) current
−
3.5
−
6 mA Negated state
I
O
−
Sink (
−
) current 3.5 6 mA Negated state
I
OZ
3-state leakage
−
20 20
µ
A V
PIN
= 0 V, 3.47 V