Rockwell Automation 1747-SN Remote I/O Scanner - Manual (Page 98)

Publication 1747-UM013B-EN-P - January 2005
A-2 Specifications
Throughput Introduction RIO throughput is defined as the time between when an input event
occurs at an I/O module in an RIO chassis to when an output event
occurs at an I/O module within the same RIO chassis. There are three
types of throughput concerning the 1747-SN Series B Scanner and its
RIO network:
• discrete throughput (time from discretely mapped input to
discretely mapped output) without block transfers (BTs) present
• discrete throughput (time from discretely mapped input to
discretely mapped output) with BTs present
• BT throughput (time from when a BT is enabled to when the BT
successfully completes)
RIO Network Throughput Components
The following components affect RIO network throughput:
• the total SLC processor scan time
• the total RIO link scan time
• adapter(s) backplane scan time(s)
• the scanner’s output delay time
• the scanner’s input delay time
• input module delay times
• output module delay times
Table A.2 DIP Switch Position for Baud Rate Selection
Baud Rate DIP Switch Position
Switch 1 Switch 2
57.6K baud on on
115.2K baud on off
230.4K baud off on
230.4K baud off off