INFICON Explorer Portable Gas Chromatograph User Manual
Page 352
Appendices
350
material, contained in devices designed and manufactured for the
purpose of detecting, measuring, gauging, or controlling thickness,
density, level, interface location, radiation, leakage, or qualitative or
quantitative chemical composition, or for producing light or an ionized
atmosphere.
(b) The general license in paragraph (a) of this section applies only to
byproduct material contained in devices which have been manufactured
or initially transferred and labeled in accordance with the specifications
contained in a specific license issued pursuant to §32.61 of this chapter
or in accordance with the specifications contained in a specific license
issued by an Agreement State, which authorizes distribution of devices
to persons generally licensed by the Agreement State.
(c) Any person who acquires, receives, possesses, uses, or transfers
byproduct material in a device pursuant to the general license in
paragraph (a) of this section:
(1) Shall assure that all labels affixed to the device at the time of
receipt, and bearing a statement that removal of the label is
prohibited, are maintained thereon and shall comply with all
instructions and precautions provided by such labels;
(2) Shall assure that the device is tested for leakage of radioactive
material and proper operation of the on-off mechanism and
indicator, if any, at no longer than six-month intervals or at such
other intervals as are specified in the label; however,
i) Devices containing only krypton need not be tested for leakage
of radioactive material, and
ii) Devices containing only tritium or not more than 100
microcuries (3.7 MBq) of other beta and/or gamma emitting
material or 10 microcuries (0.37 MBq) of alpha emitting
material and devices held in storage in the original shipping
container prior to initial installation need not be tested for any
purpose;