Yokogawa Data Acquisition with PID Control CX2000 - Manual (Page 20)

2-11
SM 04L31A01-01E
Testing
2
2.4 DIO Module Assembly Test
This section describes the test procedure for CTRL MODULE ASSY (B8700CY) which is
used on the CX1000/CX2000. This test is not necessary if you perform the general tests
in section 2.2. Perform this test when testing the module by itself.
Test Instruments
Instrument Specifications
Withstanding voltage tester AC 1 to 3 kV, 500 VDC
Jig A measurement instrument having the same functions and
characteristics as the CX1000/CX2000
Tests
• Withstand Voltage Test
Consult your nearest Yokogawa representative regarding the following tests.
• DI Test
• DIO Test
Testing Environment
Ambient temperature of 23 ± 5 ° C, relative humidity of 55 ± 20%
CAUTION
• The following assumes that the test will be performed with the module installed in
the CX1000/CX2000.
• The test cannot be performed on models having no internal control loops with no
DIO module installed.
Test Procedure
Perform a withstand voltage test on the module installed in the CX1000/CX2000 at the
points listed below.
Test Points Reference Values
DO terminal to CX1000/CX2000 earth terminal* Leakage current of 2 mA or less at 0.5 kV AC for 1 minute
DI terminal to CX1000/CX2000 earth terminal † Leakage current of 2 mA or less at 0.5 kV AC for 1 minute
* Short DO1—12 and C.
† Short all DIs.