Yokogawa Data Acquisition with PID Control CX2000 - Manual (Page 10)

2-1
SM 04L31A01-01E
Testing
2
Chapter 2 Testing
2.1 Overview of Tests
The following describes general testing procedures for DAQSTATION CX1000/CX2000
series instruments. For tests on specific modules or assemblies, see sections 2.3 and
later.
Operating Conditions
Ambient Temperature: 23 ± 2 ° C
Relative Humidity: 55
±
20%
Test Instruments
Instrument Specifications
DC voltage generator Accuracy: 0.005% of setting + 1 mV
DMM Accuracy: 0.005% of rdg + 1 mV
Resistors Accuracy: 0.01% or better
Insulation tester 500 VDC
Withstanding voltage tester AC 1 to 3 kV, 500 VDC
External monitor (for test of /D5 option) VGA monitor (H: 33.3 kHz, V: 60.168 Hz)
Oscilloscope 200 kS/s or more, isolated input
Thermostatic chamber ZC-114 (Coper Electronics Co., Ltd.) or equivalent
Testing Conditions
The tests cover all included A/D converters.
The unit's analog input is in analog multiplexer format.
For the CX1000, channel group 1–6 of the measurement input section and channel
group 7–11 of the control input section are each assigned to one A/D converter. For the
CX2000, channel groups 1–5 and 6–10 of the control input section (slot 1) and channel
groups 1–10 and 11-20 of the measurement input section (slots 2 and 3) are each
assigned to one A/D converter.
Therefore, except for when specifying inputs linked to the same A/D converter, only one arbitrary
channel within a group need be tested (for example, not channels 1—5 but only channel 1).