Atec Agilent-E4980A - Manual (Page 13)

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Short offset Zs
Table 16. Impedance of DUT > 1.08 Ω
Test Measurement time mode
frequency [Hz] SHORT MED, LONG
20 - 2 M 2.5 mΩ × (1 + 0.400/Vs) × 0.6 mΩ × (1 + 0.400/Vs) ×
(1 + √(1000/Fm)) (1 + √(1000/Fm))
Table 17. Impedance of DUT ≤ 1.08 Ω
Test Measurement time mode
frequency [Hz] SHORT MED, LONG
20 - 2 M 1 mΩ × (1 + 1/Vs) × 0.2 mΩ × (1 + 1/Vs) ×
(1 + √(1000/Fm)) (1 + √(1000/Fm))
Vs [Vrms] Test signal voltage
Fm [Hz] Test frequency
Effect of cable extension (Short offset)
Table 18. When the cable is extended, the following value is added to Zs
(independent of the measurement time mode).
Test Cable length
frequency [Hz] 0 m 1 m 2 m 4 m
20 - 1 M 0 0.25 mΩ 0.5 mΩ 1 mΩ
1 M - 2 M 0 1 mΩ 2 mΩ 4 mΩ
Open offset Yo
Table 19. Test signal voltage ≤ 2.0 Vrms
Test Measurement time mode
frequency [Hz] SHORT MED, LONG
20 - 100 k 2 nS × (1 + 0.100/Vs) × 0.5 nS × (1 + 0.100/Vs) ×
(1 + √(100/Fm)) (1 + √(100/Fm))
100 k - 1 M 20 nS × (1 + 0.100/Vs) 5 nS × (1 + 0.100/Vs)
1 M - 2 M 40 nS × (1 + 0.100/Vs) 10 nS × (1 + 0.100/Vs)
Table 20. Test signal voltage > 2.0 Vrms
Test Measurement time mode
frequency [Hz] SHORT MED, LONG
20 - 100 k 2 nS × (1 + 2/Vs) × 0.5 nS × (1 + 2/Vs) ×
(1 + √(100/Fm)) (1 + √(100/Fm))
100 k - 1 M 20 nS × (1 + 2/Vs) 5 nS × (1 + 2/Vs)
1 M - 2 M 40 nS × (1 + 2/Vs) 10 nS × (1 + 2/Vs)
Vs [Vrms] Test signal voltage
Fm [Hz] Test frequency
Note
The Open Offset may become three times
greater in the ranges of 40 to 70 kHz and 80 to
100 kHz due to residual response.