Atec Agilent-E5071B - Manual (Page 24)

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System capabilities
Familiar graphical user interface The ENA Series analyzer employs a graphical user interface based on
Windows ® operating system. There are three ways to operate the instrument
manually: you can use a hardkey interface, touch screen interface (option
E5070B/E5071B-016) or a mouse interface.
Limit lines
Limit test Define the test limit lines that appear on the display for pass/fail testing.
Defined limits may be any combination of horizontal/sloping lines and discrete
data points. The offset limit line function adjusts offset values to the frequency
and output level.
Ripple limit test Defines the stop and start frequency and the maximum allowable ripple value of
each frequency band. Ripple limit test may set up as many as 12 frequency bands
for testing ripple. The frequency bands are combined in a list that is displayed
while the ripple frequency bands are being edited.
Bandwidth limit test Defines the amplitude below the peak and the minimum and maximum allowable
bandwidths.
Web-enabled control Access to the ENA from any Java™-enable Web browser via LAN interface. ENA
can be controlled from a remote location without using special software.
Fixture simulator
Balance-unbalance conversion Convert data from single-ended measurement to balanced measurement
parameters (mixed-mode S-parameters), balanced parameters or CMRR by
using internal software.
Network de-embedding De-embed an arbitrary circuit defined by a two-port Touchstone data file
(50 Ω system) for each test port. This function eliminates error factors
between calibration plane and DUT and expands the calibration plane for each
test port. This function can be used with the port extension function.
Port reference impedance conversion Convert S-parameters measured in 50 Ω reference impedance to data
in other reference impedance levels by using internal software. This conversion
can be performed for both single-ended (unbalance) measurement ports and
converted balanced measurement ports.
Matching circuit Add one of predefined matching circuits or a circuit defined by a two-port
Touchstone data file to each single-ended test port or converted balanced
(differential) test port by using internal software.