2 introduction, 1 description, 2 device summary – Texas Instruments Digital Signal Processor SM320F2812-HT User Manual
Page 13: 2introduction
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SGUS062B
–
JUNE 2009
–
REVISED JUNE 2011
2
Introduction
This section provides a summary of the device features, lists the pin assignments, and describes the
function of each pin. This document also provides detailed descriptions of peripherals, electrical
specifications, parameter measurement information, and mechanical data about the available packaging.
3
2.1
Description
The SM320F2812 device, member of the C28xE DSP generation, is a highly integrated, high-performance
solution for demanding control applications. The functional blocks and the memory maps are described in
Section 3, Functional Overview.
Throughout this document SM320F2812 is abbreviated as F2812.
2.2
Device Summary
provides a summary of the device features.
Table 2-1. Hardware Features
FEATURE
F2812
Instruction Cycle (at 150 MHz)
6.67 ns
Single-Access RAM (SARAM) (16 bit word)
18K
3.3 V On-Chip Flash (16 bit word)
128K
On-Chip ROM (16-bit word)
—
Code Security for On-Chip Flash/SARAM/OTP/ROM
Yes
Boot ROM
Yes
OTP ROM (1K
×
16)
Yes
External Memory Interface
Yes
Event Managers A and B (EVA and EVB)
EVA, EVB
•
General-Purpose (GP) Timers
4
•
Compare (CMP)/PWM
16
•
Capture (CAP)/QEP Channels
6/2
Watchdog Timer
Yes
12 Bit ADC
Yes
•
Channels
16
32 Bit CPU Timers
3
SPI
Yes
SCIA, SCIB
SCIA, SCIB
CAN
Yes
McBSP
Yes
Digital I/O Pins (Shared)
56
External Interrupts
3
Supply Voltage
1.8-V Core, (135 MHz) 1.9-V Core
(150 MHz), 3.3-V I/O
Temperature Options
S:
–
55
°
C to 220
°
C
Yes
3
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2009–2011, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.