Metrohm Vision – Diagnostics - Manual (Page 9)

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Vision SP includes enhanced Diagnostics, designed specifically to meet the needs of users in regulated
industries who must maintain complete instrument records of performance over time, including
conformance to photometric and\ wavelength standards. Among the features are the following:
• Diagnostic Database structure to support multiple instruments, multiple sampling
configurations
• Built-in table with acceptance specifications for all current, standard Metrohm NIRSystems
instrument and sampling modules, applied by instrument configuration
• Recallable test results, with control charts to show performance changes over time
• Control charts offer both calculated control limits and manufacturer’s tolerances
• A unique screen display to show data in various formats, permitting enlargement of each area
for better interpretation
• Test timer supports all available tests, prompts operator when tests are due
• Instrument Self-Test (similar to NSAS Self-Test)
• Photometric Certification tests for supported reflectance and transmission standards
• Wavelength Certification for supported (and user-defined) wavelength standards
• Instrument Performance Verification (IPV) for regular user tests of photometric performance
• Low-Flux Test in support of pharmaceutical requirements
• Reference Standardization for users of reflectance instruments
• Instrument maintenance log with comment fields
• Blank Correction (for XDS transmission measurements)
• Instrument Calibration (for ensuring calibration transfer between XDS instruments)
• Window Correction (For XDS process systems)
• USP tests including Noise, Low-Flux Noise, Wavelength Accuracy and the Photometric
Linearity Test – with results displayed according to the USP chapter <1119>.