Metrohm Vision – Diagnostics - Manual (Page 24)

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A tabular report is shown in the lower right
quadrant, giving each peak, its nominal position
and its measured position. The difference from
nominal and the repeatability of position are
calculated. This is a sample report for an XDS
analyzer.
This report is stored in the Diagnostic Database
and can be accessed from the Diagnostic
Database Viewer at a later time.
For XDS instruments, the Wavelength Certification also tests certain measured instrument profile
peaks in the wavelength standard. These peaks are used to set the “Instrument Wavelength Profile,”
and one peak is used for bandwidth calculation.
When running Wavelength Certification on the XDS, the test may pass, but give a recommendation
to re-run the instrument calibration to improve instrument performance. For the XDS, there is a tab
at the bottom of the test results for the Instrument Calibration Verification results, which has much
tighter tolerances. If the peak positions measured during the Wavelength Certification are outside of
these tolerances, yet still acceptable for Wavelength Certification, it is recommended that the user
re-run Instrument Calibration to ensure instrument matching and seamless calibration transfer.
If Wavelength Certification fails on an XDS instrument, run Instrument Calibration under Diagnostics,
then repeat the Wavelength Certification Test. If it fails on model 5000 or 6500 instruments, run
Wavelength Linearization under Diagnostics, then repeat the Wavelength Certification. If the system
fails the test again, contact Metrohm Technical Support.