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Figure3.7 rise and fall time test conditions, Rise and fall time test conditions – Avago Technologies LSI53C180 User Manual

Page 48

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3-14

Specifications

Figure 3.7

Rise and Fall Time Test Conditions

t

F

Fall time, 90% to 10%

4.0

18.5

ns

Figure 3.7

dV

H

/dt

Slew rate, LOW to HIGH

0.15

0.50

V/ns

Figure 3.7

dV

L

/dt

Slew rate, HIGH to LOW

0.15

0.50

V/ns

Figure 3.7

ESD

Electrostatic discharge

2

kV

MIL-STD-883C;

3015-7

Latch-up

100

mA

Filter delay

20

30

ns

Figure 3.8

Ultra filter delay

10

15

ns

Figure 3.8

Ultra3 filter delay

x

x

ns

Figure 3.8

Extended filter delay

40

60

ns

Figure 3.8

1. These values are guaranteed by periodic characterization; they are not 100% tested on every device.
2. Active negation outputs only: Data, Parity, SREQ/, SACK/. (Minus Pins) SCSI mode only.
3. Single pin only; irreversible damage may occur if sustained for one second.
4. SCSI RESET pin has 10 k

pull-up resistor.

Table 3.15

TolerANT Technology Electrical Characteristics

1

(Cont.)

Symbol

Parameter

Min

Max

Units

Test Conditions

(Sheet 2 of 2)

20 pF

47

2.5 V

+