Measurement Computing CIO-DAS160x/1x - Manual (Page 30)

6.1.9 PROGRAMMABLE GAIN CONTROL REGISTER / BURST RATE
BASE ADDRESS + Bh
G0 G1 X X X X X X
0 1 2 3 4 5 6 7
BURST RATE is fixed at: CIO-DAS1600/12 = 4
µs (250 kHz) between burst samples.
CIO-DAS1602/16 = 13.3
µs between burst samples (75 kHz).
PROGRAMMABLE GAIN CONTROL: Range and gain is controlled by bits G1 and G0. The codes
have different meaning for each board in the DAS1600 family (Table 6-4).
Table 6-4. Range Codes
0 to 1.25V +/-1.25V 3
0 to 2.5V +/-2.5V 2
0 to 5V +/-5V 1
0 to 10V +/-10V 0 CIO-DAS1602/12
and
CIO-DAS1602/16
0 to 0.01V +/-0.01V 3
0 to 0.1V +/-0.1V 2
0 to 1V +/-1V 1
0 to 10V +/-10V 0 CIO-DAS1601/12
UNIPOLAR RANGE BIPOLAR RANGE CODE BOARD
The range, unipolar or bipolar is controlled by a switch. If your application is better served by
programmable ranges, please consider the CIO-DAS16/Jr or CIO-DAS16/330 boards.
DT-CONNECT NOTE:
To guarantee that DT-Connect is properly initialized prior to any A/D transfer, the DT-Connect
DT-Request handshake line is reset each time this register is written to. Therefore, it is not possible to
use the DT-Connect for A/D sets which involve setting the gain between samples. This is not really a
problem because any such scheme would be low speed and therefore store data to disk, obviating the
need to use DT-Connect to store data on the MEGA-FIFO.
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