Teledyne LeCroy HDO6000 Operators Manual - Manual (Page 91)

Operator's Manual
Analysis
Most Teledyne LeCroy oscilloscopes calculate measurements for all instances in the acquisition,
enabling you to rapidly and thoroughly analyze a long memory acquisition of thousands or millions of
parameter values to find anomalous measurements, or to apply a variety of mathematical functions to the
waveform trace.
These measurements and manipulations of the original input signal can be viewed in several graphical
formats to facilitate your analysis.
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Histograms display the distribution of measured values for a given parameter as a bar chart. See
About Histograms .
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Tracks provide a time-correlated view of a measurement parameter compared to other acquired
channels or calculated math traces. A common usage for track is to observe the modulation of a
signal, such as amplitude, frequency, or pulse width modulation. See
View Track .
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Trends provide a view of a measurement parameter over an extended period of time and over mul-
tiple acquisitions. See
View Trend and Track vs. Trend to better understand what a Trend provides
compared to a Track.
There are also conditional tests that can be applied to the data to find particular events:
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Pass/Fail Testing , including Pass/Fail Testing , finds normal/abnormal measurements as indicated
by whether or not they meet a set of defined criteria.
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WaveScan searches a single acquisition for events that meet specific criteria, enabling you to zoom
in on anomalies in the waveform, or scans multiple acquisitions with allowable trigger actions when
conditions are met. It can also be used to filter measurements. A variety of views help you under-
stand the behavior of waveforms.
Finally, History Mode facilitates analysis by enabling you to quickly return the waveform display to any
point in an acquisition history.
Optional software packages may be purchases that simplify specialized analysis, such as various Serial
Data Decode options. These all add new methods to those available on the oscilloscope Analysis menu.
View Histogram
1. If you are not already on the Measure or Math dialog, choose Measure → Measure Setup... or Math →
Math Setup...from the menu bar.
2. Touch the tab for the measurement parameter or math function you wish to histogramand check
Trace On.
3. If you're already on the Fx dialog, touch the graph button and skip to Step 5.
OR
Touch the Histogram button at the bottom of the Px dialog and choose the math trace (F1-F12) in
which to display the histogram.
The histogram opens in a new grid along with its function descriptor box.
4. Touch the new Fx descriptor box to display the Fx dialog.
5. Touch the Histogram tab at the right to display the Histogram right-hand dialog.
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