Rainbow Electronics AT83C24NDS - Manual (Page 32)

32
4234F–SCR–10/05
AT83C24
Rise and Fall Slew rate
0.2
0.12 V/ns
CLASS A
CCLK from 0.5 to 4.2V
CLASS B
CCLK from 0.5 to 0.85 x
CVCC
Low level voltage stability
(taking into account PCB design)
-0.25 0.5 V CLASS A&B&C
High level voltage stability
(taking into account PCB design)
4.2
2.35
CVCC-0.4
CVCC+0.25
CVCC+0.25
CVCC+0.25
V
CVCC = CLASS A
CVCC = CLASS B
CLASS C
CCLK Smart card clock frequency 24 MHz C
L
= 30pF, CLK=48MHz
Table 23. Smart Card Clock (CCLK pin) (Continued)
Symbol Parameter Min Typ Max Unit Test Conditions
Table 24. Smart Card I/O (CIO, CC4, CC8 pins)
Symbol Parameter Min Typ Max Unit Test Conditions
V
IL
Input Low-voltage -0.3V 0.8 V I
IL
= 500 µA
I
IL
Input Low Current 700 µA CVCC = CLASS A&B&C
V
IH
Input High Voltage
0.6 x CVCC
0.7 x CVCC
CVCC
CVCC
V
CVCC = CLASS A
CVCC = CLASS B & C
I
IH
Input High Current -20 +20
μA
V
OL
Output Low-voltage 0
0.45
0.3
0.3
V
I
OL
= -1 mA CLASS A
I
OL
= -1 mA CLASS B
I
OL
= -1 mA CLASS C
V
OH
Output High Voltage
0.75 x CVCC
0.9 x CVCC
CVCC
CVCC
V
I
OH
= 40
μA CLASS
A&B&C
I
OH
= 0
μ
A, CLASS A&B
I
OS
Output Short Circuit Current -15 +15 mA Short to GND or CVCC
Low level voltage stability
(taking into account PCB design)
-0.25
-0.25
-0.25
0.6
0.4
0.4
V
CLASS A
CLASS B
CLASS C
High level voltage stability
(taking into account PCB design)
CVCC-0.5 CVCC+0.25 V CVCC = CLASS A&B&C
t
R
t
F
Output rise and fall time
0.1
μ
s
C
L
= 65 pF
CLASS A:
measurement between
0.6V and 70% of CVCC
CLASS B & C:
measurement between
0.4V and 70% of CVCC
t
R
t
F
Input rise and fall time 1
μ
s C
L
= 65 pF