Texas Instruments 5000 User Manual
Page 101

Table 4-2 Self-Test Beep Codes (continued)
Beep Code
Port 80h
Description
2-3-3
1Ah
Bit A, 1ST 64K RAM Failure
2-3-4
1Bh
Bit B, 1ST 64K RAM Failure
2-4-1
1Ch
Bit C, 1ST 64K RAM Failure
2-4-2
1Dh
Bit D, 1ST 64K RAM Failure
2-4-3
1Eh
Bit E, 1ST 64K RAM Failure
2-4-4
1Fh
Bit F, 1ST 64K RAM Failure
3-1-1
20h
Slave DMA Register Failure
3-1-2
21h
Master DMA Register Failure
3-1-3
22h
Master Interrupt Mask Register Failure
3-1-4
23h
Slave Interrupt Mask Register Failure
None
25h
Interrupt Vector Loading In Progress
3-2-4
27h
Keyboard Controller Test Failure
None
28h
CMOS Power Failure and Checksum in
Progress
None
29h
CMOS Configuration Validation in Progress
3-3-4
2Bh
Screen Memory Test Failure
3-4-1
2Ch
Screen Initialization Failure
3-4-2
2Dh
Screen Retrace Test Failure
None
2Eh
Search for Video ROM in progress
None
30h
Screen Believed Operable; running with
Video ROM
None
31h
Monochrome Monitor Believed Operable
None
32h
Color Monitor (40 Column) Believed
Operable
None
33h
Color Monitor (80 Column) Believed Operable
4-2-1
34h
No Time Tick
4-2-2
35h
Shutdown Failure
4-2-3
36h
Gate A20 Failure
4-2-4
37h
Unexpected Interrupt in Protected Mode
4-3-1
38h
Memory High Address Line Failure at
010000h-0A0000h
4-3-3
3Ah
Timer Chip Counter 2 Failed
4-3-4
3Bh
Time of Day Clock Stopped
4-4-1
3Ch
Serial Port Failure
4-4-2
3Dh
Parallel Port Failure
4-4-3
3Eh
Math Co-processor Failure
Troubleshooting Procedures 4-9